IRPS 2010
Dr. Yasumasa Tsukamoto, a distinguished SRAM designer visiting from Renesas Technology, published a paper at the 2010 International Reliability Physics Symposium on "Analysis of the Relationship between Random Telegraph Signal and Negative Bias Temperature Instability." This work was done in collaboration with Seng Oon Toh, Changhwan Shin, Andrew Mairena, Prof. Tsu-Jae King Liu, and Prof. Borivoje Nikolic.