IEDM 2009 Conference
September 22nd, 2009 by sengoon
A paper from our group, titled “Impact of Random Telegraph Signals on Vmin in 45nm SRAM,” authored by Seng Oon Toh, Yasumasa Tsukamoto, Zheng Guo, Lauren Jones, Tsu-Jae King Liu, and Borivoje Nikolic has been accepted for presentation at the 2009 International Electron Devices Meeting (IEDM). The paper will be presented in Baltimore, Maryland on December 9th.